A Relay Discharged FICDM Method for Improved Repeatability

Matthew  Drallmeier; Lena Zeitlhoefler; Huiping Yang; Wei Huang; Friedrich Zur Nieden; David Johannes Pommerenke

A Relay Discharged FICDM Method for Improved Repeatability

Matthew Drallmeier
, Lena Zeitlhoefler
, Huiping Yang
, Wei Huang
, Friedrich Zur Nieden
, David Johannes Pommerenke

Institut für Elektronik (4390)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

- A new design for CDM testing is proposed that retains the field charging DDT method while providing a consistent discharge inside of a reed switch. The method is shown to adhere to the current JS-002 standard and to perform at low voltages, but JS-002 failures could not be exactly replicated.

Originalsprache	englisch
Titel	Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020
Seitenumfang	9
ISBN (elektronisch)	978-1-7281-9461-5
Publikationsstatus	Veröffentlicht - 13 Sept. 2020
Veranstaltung	42nd Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2020 - Reno, USA / Vereinigte Staaten Dauer: 13 Sept. 2020 → 18 Sept. 2020

Konferenz

Konferenz	42nd Annual Electrical Overstress/Electrostatic Discharge Symposium
Kurztitel	EOS/ESD 2020
Land/Gebiet	USA / Vereinigte Staaten
Ort	Reno
Zeitraum	13/09/20 → 18/09/20

ASJC Scopus subject areas

Elektrotechnik und Elektronik

Zugriff auf Dokument

https://ieeexplore.ieee.org/document/9241329

Andere Dateien und Links

https://www.scopus.com/pages/publications/85097148224

Dieses zitieren

Drallmeier, M, Zeitlhoefler, L, Yang, H, Huang, W, Zur Nieden, F & Pommerenke, DJ 2020, A Relay Discharged FICDM Method for Improved Repeatability. in Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020. 42nd Annual Electrical Overstress/Electrostatic Discharge Symposium, Reno, USA / Vereinigte Staaten, 13/09/20. <https://ieeexplore.ieee.org/document/9241329>

@inproceedings{e790a04098034695a351ff898b763adb,

title = "A Relay Discharged FICDM Method for Improved Repeatability",

abstract = "- A new design for CDM testing is proposed that retains the field charging DDT method while providing a consistent discharge inside of a reed switch. The method is shown to adhere to the current JS-002 standard and to perform at low voltages, but JS-002 failures could not be exactly replicated.",

author = "Matthew Drallmeier and Lena Zeitlhoefler and Huiping Yang and Wei Huang and \{Zur Nieden\}, Friedrich and Pommerenke, \{David Johannes\}",

year = "2020",

month = sep,

day = "13",

language = "English",

booktitle = "Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020",

note = "42nd Annual Electrical Overstress/Electrostatic Discharge Symposium : EOS/ESD 2020, EOS/ESD 2020 ; Conference date: 13-09-2020 Through 18-09-2020",

}

TY - GEN

T1 - A Relay Discharged FICDM Method for Improved Repeatability

AU - Drallmeier, Matthew

AU - Zeitlhoefler, Lena

AU - Yang, Huiping

AU - Huang, Wei

AU - Zur Nieden, Friedrich

AU - Pommerenke, David Johannes

PY - 2020/9/13

Y1 - 2020/9/13

N2 - - A new design for CDM testing is proposed that retains the field charging DDT method while providing a consistent discharge inside of a reed switch. The method is shown to adhere to the current JS-002 standard and to perform at low voltages, but JS-002 failures could not be exactly replicated.

AB - - A new design for CDM testing is proposed that retains the field charging DDT method while providing a consistent discharge inside of a reed switch. The method is shown to adhere to the current JS-002 standard and to perform at low voltages, but JS-002 failures could not be exactly replicated.

UR - https://www.scopus.com/pages/publications/85097148224

M3 - Conference paper

BT - Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020

T2 - 42nd Annual Electrical Overstress/Electrostatic Discharge Symposium

Y2 - 13 September 2020 through 18 September 2020

ER -

A Relay Discharged FICDM Method for Improved Repeatability

Abstract

Konferenz

ASJC Scopus subject areas

Zugriff auf Dokument

Andere Dateien und Links

Fingerprint

Dieses zitieren