A Method to Measure the Electromagnetic Emission Induced by Electromagnetic Interference of Integrated Circuits

In this paper, we present a method to characterize the electromagnetic emission (EME) of integrated circuits (ICs) caused by electromagnetic interference (EMI). Normally, emission and immunity of ICs are measured separately, but this does not correspond exactly to the application. In reality, an IC always experiences disturbances at its inputs. In order to better illustrate and understand the more realistic measurement of the emission behaviour of an IC, taking into account disturbances on its inputs, we introduce the ELectromagnetic InTerference and Emission (ELITE) plot. The ELITE plot is particularly useful for visually representing the EME caused by EMI, and provides a clear understanding of how the electromagnetic emission changes with the frequency of the interference signal. The method involves applying a disturbance signal in the frequency range 1MHz to 1GHz to one pin of the IC and measuring the EME simultaneously at another IC pin. We demonstrate the use of this method with a smart power high-side switch as an example. We also provide instructions for creating an ELITE plot from measurements using a measurement setup combining the direct power injection (DPI) and 150Ω method.