A Combined Model for Transient and Self-Heating of Snapback Type ESD Protection Devices

Xin Yan; Seyed Mostafa Mousavi; Li Shen; Yang Xu; Wei Zhang; Sergej Bub; Steffen Holland; David Pommerenke; Daryl G. Beetner

doi:10.23919/EOS/ESD58195.2023.10287666

A Combined Model for Transient and Self-Heating of Snapback Type ESD Protection Devices

Xin Yan
, Seyed Mostafa Mousavi
, Li Shen
, Yang Xu
, Wei Zhang
, Sergej Bub
, Steffen Holland
, David Pommerenke
, Daryl G. Beetner

Institut für Elektronik (4390)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

A simplified physics-based model for predicting the transient response and self-heating behavior of silicon-controlled rectifier (SCR) snapback-type transient voltage suppressors (TVS) is presented. Comparisons of the predicted quasi-static behavior and transient waveforms with measurements suggest that the proposed model accurately captures the most important characteristics of the device. Its simplified nature means it can be easily tuned using only data obtained from package-level measurements.

Originalsprache	englisch
Titel	Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2023 - Proceedings
Herausgeber (Verlag)	ACM/IEEE
Seiten	1-7
Seitenumfang	7
ISBN (elektronisch)	9781585373475
ISBN (Print)	979-8-3503-2086-2
DOIs	https://doi.org/10.23919/EOS/ESD58195.2023.10287666
Publikationsstatus	Veröffentlicht - 4 Okt. 2023
Veranstaltung	45th Annual EOS/ESD Symposium: EOS/ESD 2023 - Riverside, USA / Vereinigte Staaten Dauer: 2 Okt. 2023 → 4 Okt. 2023

Konferenz

Konferenz	45th Annual EOS/ESD Symposium
Kurztitel	EOS/ESD 2023
Land/Gebiet	USA / Vereinigte Staaten
Ort	Riverside
Zeitraum	2/10/23 → 4/10/23

ASJC Scopus subject areas

Elektrotechnik und Elektronik

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10.23919/EOS/ESD58195.2023.10287666

https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10287666

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Yan, X., Mousavi, S. M., Shen, L., Xu, Y., Zhang, W., Bub, S., Holland, S., Pommerenke, D., & Beetner, D. G. (2023). A Combined Model for Transient and Self-Heating of Snapback Type ESD Protection Devices. in Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2023 - Proceedings (S. 1-7). Artikel 10287666 ACM/IEEE. https://doi.org/10.23919/EOS/ESD58195.2023.10287666

Yan, X, Mousavi, SM, Shen, L, Xu, Y, Zhang, W, Bub, S, Holland, S, Pommerenke, D & Beetner, DG 2023, A Combined Model for Transient and Self-Heating of Snapback Type ESD Protection Devices. in Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2023 - Proceedings., 10287666, ACM/IEEE, S. 1-7, 45th Annual EOS/ESD Symposium, Riverside, USA / Vereinigte Staaten, 2/10/23. https://doi.org/10.23919/EOS/ESD58195.2023.10287666

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title = "A Combined Model for Transient and Self-Heating of Snapback Type ESD Protection Devices",

abstract = "A simplified physics-based model for predicting the transient response and self-heating behavior of silicon-controlled rectifier (SCR) snapback-type transient voltage suppressors (TVS) is presented. Comparisons of the predicted quasi-static behavior and transient waveforms with measurements suggest that the proposed model accurately captures the most important characteristics of the device. Its simplified nature means it can be easily tuned using only data obtained from package-level measurements.",

keywords = "Heating systems, Temperature measurement, Transient response, Thyristors, TV, Predictive models, Data models",

author = "Xin Yan and Mousavi, \{Seyed Mostafa\} and Li Shen and Yang Xu and Wei Zhang and Sergej Bub and Steffen Holland and David Pommerenke and Beetner, \{Daryl G.\}",

year = "2023",

month = oct,

day = "4",

doi = "10.23919/EOS/ESD58195.2023.10287666",

language = "English",

isbn = "979-8-3503-2086-2",

pages = "1--7",

booktitle = "Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2023 - Proceedings",

publisher = "ACM/IEEE",

note = "45th Annual EOS/ESD Symposium : EOS/ESD 2023, EOS/ESD 2023 ; Conference date: 02-10-2023 Through 04-10-2023",

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T1 - A Combined Model for Transient and Self-Heating of Snapback Type ESD Protection Devices

AU - Yan, Xin

AU - Mousavi, Seyed Mostafa

AU - Shen, Li

AU - Xu, Yang

AU - Zhang, Wei

AU - Bub, Sergej

AU - Holland, Steffen

AU - Pommerenke, David

AU - Beetner, Daryl G.

PY - 2023/10/4

Y1 - 2023/10/4

N2 - A simplified physics-based model for predicting the transient response and self-heating behavior of silicon-controlled rectifier (SCR) snapback-type transient voltage suppressors (TVS) is presented. Comparisons of the predicted quasi-static behavior and transient waveforms with measurements suggest that the proposed model accurately captures the most important characteristics of the device. Its simplified nature means it can be easily tuned using only data obtained from package-level measurements.

AB - A simplified physics-based model for predicting the transient response and self-heating behavior of silicon-controlled rectifier (SCR) snapback-type transient voltage suppressors (TVS) is presented. Comparisons of the predicted quasi-static behavior and transient waveforms with measurements suggest that the proposed model accurately captures the most important characteristics of the device. Its simplified nature means it can be easily tuned using only data obtained from package-level measurements.

KW - Heating systems

KW - Temperature measurement

KW - Transient response

KW - Thyristors

KW - TV

KW - Predictive models

KW - Data models

UR - https://ieeexplore.ieee.org/document/10287666/

UR - https://www.scopus.com/pages/publications/85179005792

U2 - 10.23919/EOS/ESD58195.2023.10287666

DO - 10.23919/EOS/ESD58195.2023.10287666

M3 - Conference paper

SN - 979-8-3503-2086-2

SP - 1

EP - 7

BT - Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2023 - Proceedings

PB - ACM/IEEE

T2 - 45th Annual EOS/ESD Symposium

Y2 - 2 October 2023 through 4 October 2023

ER -

A Combined Model for Transient and Self-Heating of Snapback Type ESD Protection Devices

Abstract

Konferenz

ASJC Scopus subject areas

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